This document discusses different types of interferometers used for measurement. It describes the principles of interference that occur when two light waves meet, including conditions for constructive and destructive interference. It then explains several specific interferometers - Michelson, Fabry-Perot, fringe counting, NPL flatness, Pitter-NPL, and laser - detailing how each works and what types of measurements each can perform. The NPL flatness interferometer and Pitter-NPL gauge interferometer are explained in more depth with diagrams of their components and working principles.

1. INTERFEROMETRY
By
Mr.H.P.Varade
Asst.Professor,
Sanjivani CoE,Kopargaon,Dist-Ahmednagar
MQC : UNIT-2

2. INTERFEROMETRY
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3. Principle of Interference
If two rays of same wavelength meet at
some point, mutual interference occurs &
natural interference depends on Phase of two
waves at their meeting point.
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4. •If two rays are in same
phase, then resulting
intensity will be the sum of
two intensity.
•If two rays are out of phase,
then resulting intensity will be
the difference of two
intensity.
•If two rays having same
amplitude are out of phase,
then resultant will be zero &
result will be Dark spot.
•If two rays having same
amplitude are in same
phase, then resultant will be
twice & result will be
Bright spot.
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5. Types of Interferometers
1. Michelson Interferometer
2. Fabry-Perot Interferometer
3. Fringe counting Interferometer
4. NPL Flatness Interferometer
5. Pitter-NPL Interferometer
6. Zeiss gauge block Interferometer
7. Multiple beam Interferometer
8. Laser Interferometer
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6. NPL Flatness Interferometer
The NPL flatness interferometer is used
for checking flatness between gauge
surfaces.
(a) Equal fringes on
parallel
(b) Unequal fringes
due to flatness error
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7. •The light from a mercury vapour lamp is condensed and passed through
a green filter, resulting in a green monochromatic light source.
•The light will now pass through a pinhole, giving an intense point
source of monochromatic light.
•Therefore, the collimating lens projects a parallel beam of light onto the
face of the gauge to be tested via an optical flat.
•This results in the formation of interference fringes.
•The light beam, which carries an image of the fringes, is reflected back
and directed by 90° using a glass plate reflector.
•In Fig. (a), the fringes are parallel and equal in number on the two
surfaces. Obviously, the two surfaces are parallel, which means that the
gauge surface is perfectly flat.
•On the other hand, in Fig. (b), the number of fringes is unequal and,
since the base plate surface is ensured to be perfectly flat, the work piece
surface has a flatness error.
Working
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8. Pitter–NPL Gauge Interferometer
•This interferometer is used for determining
actual lengths of slip gauges.
•Illuminator provides a concentrated light source
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9. •Light from a monochromatic source (the preferred light source is a cadmium
lamp) is condensed by a condensing lens and focused onto an illuminating
aperture.
•This provides a concentrated light source. Thus, a parallel beam of light falls on a
constant deviation prism.
•This prism splits the incident light into light rays of different wavelengths and
hence different colors. The user can select a desired color by varying the angle of
the reflecting faces of the prism relative to the plane of the base plate.
•The prism turns the light by 90° and directs it onto the optical flat.
•The optical flat can be positioned at a desired angle by means of a simple
arrangement. The slip gauge that is to be checked is kept right below the optical
flat on top of the highly flat surface of the base plate.
•The lower portion of the optical flat is coated with a film of aluminum, which
transmits and reflects equal proportions of the incident light.
• The light is reflected from three surfaces, namely the surface of the optical flat,
the upper surface of the slip gauge, and the surface of the base plate.
•Light rays reflected from all the three surfaces pass through the optical system
again; however, the axis is slightly deviated due to the inclination of the optical
flat. This slightly shifted light is captured by another prism, so that the fringe
Working:-
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10. Field of view of fringe pattern
It can be seen that the two sets of
fringes are displaced by an amount
a with respect to each other. The
value of a varies depending on the
color of the incident light. The
displacement a is expressed as a
fraction of the fringe spacing b,
which is as follows:
f = a/b
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11. Laser Interferometers
•Laser interferometers can be
used for measurements of small
diameters as well as large
displacements.MQC : UNIT-2

12. •Laser light first falls on the semi-reflector P, is partially reflected by
90° and falls on the other reflector S.
•A portion of light passes through P and strikes the corner cube. Light
is turned through 180° by the corner cube and recombines at the semi-
reflector S.
•If the difference between these two paths of light (PQRS − PS) is an
odd number of half wavelengths, then interference will occur at S and
the diode output will be at a minimum. On the other hand, if the path
difference is an even number of half wavelengths, then the
photodiodes will register maximum output.
Each time, the moving slide is displaced by a quarter wavelength,
the path difference (i.e., PQRS − PS) becomes half a wavelength
and the output from the photodiode also changes from maximum
to minimum or vice versa.
Working:-
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