1. Development of SiC-Based PEBB 1000
July 28, 2016
PWM DC-DC
Flyback Converters
Pedro Campos Fernandes
Jun Wang
2. 1. One-Switch Flyback Converter
Advantages
Simplicity: fewer semiconductor and magnetic components
Low cost
Disadvantages
Resonance caused by the leakage inductance and the device junction capacitances
High-frequency ringing and EMI
July 28, 2016 2Development of SiC-Based PEBB 1000
4. 2. Ideal One-Switch Flyback Converter
Simulation model:
July 28, 2016 4Development of SiC-Based PEBB 1000
5. 2.1. CCM Operation
2.1.1. First Stage: DTS
Q is ON
D is OFF
Energy from the DC source
is stored in LM
July 28, 2016 5Development of SiC-Based PEBB 1000
6. 2.1. CCM Operation
2.1.2. Second Stage: (1-D)TS
Q is OFF
D is ON
Transformer voltage reverses
forward-biasing the rectifier diode
and delivering energy to the output
July 28, 2016 6Development of SiC-Based PEBB 1000
8. 3. Non-Ideal One-Switch Flyback Converter
Simulation model:
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9. 3.1. CCM Operation
3.1.1. First Stage: DTS
Subinterval 1:
Q is switching from OFF to ON
D is switching from ON to OFF
Switch transient ringing
July 28, 2016 9Development of SiC-Based PEBB 1000
10. 3.1. CCM Operation
3.1.1. First Stage: DTS
Subinterval 2:
Q is effectively ON
D is effectively OFF
No switch transient ringing
July 28, 2016 10Development of SiC-Based PEBB 1000
11. 3.1. CCM Operation
3.1.2. Second Stage: (1-D)TS
Subinterval 3:
Q is switching from ON to OFF
D is switching from OFF to ON
Switch transient ringing
July 28, 2016 11Development of SiC-Based PEBB 1000
12. 3.1. CCM Operation
3.1.2. Second Stage: (1-D)TS
Subinterval 4:
Q is effectively OFF
D is effectively ON
No switch transient ringing
July 28, 2016 12Development of SiC-Based PEBB 1000
13. 3.2. Ideal Case vs. Parasitic Case
July 28, 2016 Development of SiC-Based PEBB 1000 13
14. 3.2. Ideal Case vs. Parasitic Case
July 28, 2016 Development of SiC-Based PEBB 1000 14
15. 4. Two-Switch Flyback Converter
Advantages
Maximum switch voltage is clamped to the DC input voltage Vin
Leakage inductance energy is also clamped and recycled back to the DC
input source (improve efficiency)
Reduced switching and conduction losses
July 28, 2016 Development of SiC-Based PEBB 1000 15
17. 5. Non-Ideal Two-Switch Flyback Converter
Simulation model:
July 28, 2016 17Development of SiC-Based PEBB 1000
18. 5.1. CCM Operation
5.1.1. First Stage: DTS
Subinterval 1:
Q1, Q2 are switching from OFF to ON
D is switching from ON to OFF
D1, D2 are OFF
Switch transient ringing
July 28, 2016 18Development of SiC-Based PEBB 1000
19. 5.1. CCM Operation
5.1.1. First Stage: DTS
Subinterval 2:
Q1, Q2 are effectively ON
D is effectively OFF
D1, D2 are OFF
No transient ringing
July 28, 2016 19Development of SiC-Based PEBB 1000
20. 5.1. CCM Operation
5.1.2. Second Stage: (1-D)TS
Subinterval 3:
Q1, Q2 are switching from ON to OFF
D is switching from OFF to ON
D1, D2 are OFF
Voltage spike
July 28, 2016 20Development of SiC-Based PEBB 1000
21. 5.1. CCM Operation
5.1.2. Second Stage: (1-D)TS
Subinterval 4:
Q1, Q2 are switching from ON to OFF
D is effectively ON
D1, D2 are ON
Switch voltages VDS1, VDS2 are clamped
to Vin
July 28, 2016 21Development of SiC-Based PEBB 1000
22. 5.1. CCM Operation
5.1.2. First Stage: DTS
Subinterval 5:
Q1, Q2 are switching from ON to OFF
D is ON
D1, D2 are switching from ON to OFF
Switch transient ringing
July 28, 2016 22Development of SiC-Based PEBB 1000
23. 5.1. CCM Operation
5.1.2. First Stage: DTS
Subinterval 6
Q1, Q2 are effectively OFF
D is ON
D1, D2 are effectively OFF
No transient ringing
July 28, 2016 23Development of SiC-Based PEBB 1000
24. 5.2. One-Switch vs. Two-Switch
July 28, 2016 Development of SiC-Based PEBB 1000 24
25. 5.2. One-Switch x Two-Switch
July 28, 2016 Development of SiC-Based PEBB 1000 25
26. 5.3. Component Mismatches
Real applications do not provide perfect symmetry
between junction capacitances and gate driver signals
There are mismatches between these variables and
they lead to different behaviors during the converter
operation
July 28, 2016 Development of SiC-Based PEBB 1000 26
27. 5.3. Component Mismatches
Two types of mismatch will be covered:
20% mismatch on drain-source capacitance of the low side
MOSFET switch Q2 given the high side MOSFET switch Q1
as reference
5% delay (given the period as reference) on the gate driver of
the low side MOSFET switch Q2
July 28, 2016 Development of SiC-Based PEBB 1000 27
28. 5.3. Component Mismatches
5.3.1. Capacitance Mismatch
CDS1 = 120 pF and CDS2 = 144 pF
Q1 is clamped earlier than Q2, i.e.,
D1 starts conducting earlier than D2
Q1, Q2 voltages reach different
steady values after the ringing dies
July 28, 2016 Development of SiC-Based PEBB 1000 28
29. 5.3. Component Mismatches
5.3.2. Gate Drive Delay Mismatch
DelayQ1 = 0 s and DelayQ2 = 0.17 us
Q2 turns ON later, so Q1 will be clamped
earlier
Q1 turns ON earlier, leading to another
clamping action during the delayed turn ON
of Q2
July 28, 2016 Development of SiC-Based PEBB 1000 29
31. 5.3. Component Mismatches
Possible Solutions
Design an integrated solution with complete control circuit and
gate drive for both high side (Q1) and low side (Q2) switches
Work with safety margins so that the circuit can still present
good performance for a certain percentage of mismatch
July 28, 2016 Development of SiC-Based PEBB 1000 31
32. 6. Power Losses on Flyback Converters
Design considerations:
Zero winding resistances (rprimary = rsecondary = 0)
Zero leakage resistance
The MOSFET switches and clamping diodes are considered
symmetrical to each other
Two-Switch topology - switches model: IRF510
100 V, 5 A, ron,max = 0.85 Ω and CDS = 60 pF
One-Switch topology - switch model: IRF840
500 V, 8 A, ron,max = 0.54 Ω and CDS = 120 pF
Rectifier Diode model: MBR10100
100 V, 10 A, VF = 0.65 V and rF = 20 mΩ with CJ = 200 pF
Clamping Diodes model: MBR10100
100 V, 10 A, VF = 0.65 V and rF = 20 mΩ with CJ = 0 F
July 28, 2016 Development of SiC-Based PEBB 1000 32
33. 6. Power Losses on Flyback Converters
Losses presented by the design:
Conduction Losses
Forward Voltage Losses
Switching Losses
July 28, 2016 Development of SiC-Based PEBB 1000 33
34. 6.1. Conduction Losses
6.1.1. MOSFET Switches Q1, Q2
Since Q1, Q2 are symmetrical to each other, conduction losses will be given by:
𝑃𝑐𝑜𝑛𝑑,𝑄1 = 𝑃𝑐𝑜𝑛𝑑,𝑄2 = 𝑟𝑂𝑁,𝑄 𝐼 𝑅𝑀𝑆,𝑄
2
= 𝑟𝑂𝑁,𝑄 𝐼 𝑅𝑀𝑆,1
2
6.1.2. Rectifier Diode D3
𝑃𝑐𝑜𝑛𝑑,𝐷3 = 𝑟𝑂𝑁,𝐷3 𝐼 𝑅𝑀𝑆,𝐷3
2
= 𝑟𝑂𝑁,𝑄 𝐼 𝑅𝑀𝑆,2
2
6.1.3. Clamping Diodes D1, D2
Since Q1, Q2 are symmetrical to each other, conduction losses will be given by:
𝑃𝑐𝑜𝑛𝑑,𝐷1 = 𝑟𝑂𝑁,𝐷1 𝐼 𝑅𝑀𝑆,𝐷1
2
𝑃𝑐𝑜𝑛𝑑,𝐷2 = 𝑟𝑂𝑁,𝐷2 𝐼 𝑅𝑀𝑆,𝐷2
2
And
𝑃𝑐𝑜𝑛𝑑,𝐷1 = 𝑃𝑐𝑜𝑛𝑑,𝐷2
July 28, 2016 Development of SiC-Based PEBB 1000 34
35. 6.2. Forward Voltage Losses
6.2.1. Rectifier Diode D3
The average power dissipated by the forward voltage across the ON stage rectifier
diode is given by:
𝑃𝑓𝑜𝑟,𝐷3 = 𝑉𝑓𝑜𝑟,𝐷3 𝐼 𝑎𝑣𝑔,𝐷3
6.2.2. Clamping Diodes D1, D2
The average power dissipated by the forward voltage across the ON stage
clamping diodes is given by:
𝑃𝑓𝑜𝑟,𝐷1 = 𝑉𝑓𝑜𝑟,𝐷1 𝐼 𝑎𝑣𝑔,𝐷1
𝑃𝑓𝑜𝑟,𝐷2 = 𝑉𝑓𝑜𝑟,𝐷2 𝐼 𝑎𝑣𝑔,𝐷2
And
𝑃𝑓𝑜𝑟,𝐷1 = 𝑃𝑓𝑜𝑟,𝐷2
July 28, 2016 Development of SiC-Based PEBB 1000 35
36. 6.3. Switching Losses
Switching Losses on the MOSFET switches can be obtained by
the simplified formulation presented on [4]:
𝑃𝑠𝑤,𝑄1 =
1
2
𝑓𝑠𝑤 𝐶 𝐷𝑆1 𝑉𝐷𝑆1
2
𝑃𝑠𝑤,𝑄2 =
1
2
𝑓𝑠𝑤 𝐶 𝐷𝑆2 𝑉𝐷𝑆2
2
And
𝑃𝑠𝑤,𝑄1 = 𝑃𝑠𝑤,𝑄2 = 𝑃𝑠𝑤
July 28, 2016 Development of SiC-Based PEBB 1000 36
37. 6.4. Total Power Loss
The total power loss of the circuit is given by:
𝑃𝑙𝑜𝑠𝑠 = 𝑃𝑐𝑜𝑛𝑑 + 𝑃𝑓𝑜𝑟 + 𝑃𝑠𝑤
With
𝑃𝑐𝑜𝑛𝑑 = 𝑃𝑐𝑜𝑛𝑑,𝑄1 + 𝑃𝑐𝑜𝑛𝑑,𝑄2 + 𝑃𝑐𝑜𝑛𝑑,𝐷3 + 𝑃𝑐𝑜𝑛𝑑,𝐷1 + 𝑃 𝑐𝑜𝑛𝑑,𝐷2
𝑃𝑓𝑜𝑟 = 𝑃𝑓𝑜𝑟,𝐷3 + 𝑃𝑓𝑜𝑟,𝐷1 + 𝑃𝑓𝑜𝑟,𝐷2
July 28, 2016 Development of SiC-Based PEBB 1000 37
38. 6.5. Results
Initial Considerations
The simulation time covered 0 to 0.05s
The samples were saved on a .mat file and a reused on a MATLAB
script in order to compute the losses
The RMS and average currents were computed considering one
switching cycle only at steady state
July 28, 2016 Development of SiC-Based PEBB 1000 38
39. 6.5. Results
July 28, 2016 Development of SiC-Based PEBB 1000 39
0.064
0.353
0.433
0.849
0.874
0.074
0.355
0.042
0.470
0.924
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Condcution Losses Forward Voltage Losses Switching Losses Total Losses Efficiency
Power Losses at CCM (W)
One-Switch Two-Switch
40. 6.5. Results
Comparison of the performance of the converters in
CCM:
The conduction losses slightly increased due to the presence
of more components on the two-switch topology
The switching losses were drastically reduced
The efficiency increased 5 %
July 28, 2016 Development of SiC-Based PEBB 1000 40
41. 6.5. Results
July 28, 2016 Development of SiC-Based PEBB 1000 41
0.064
0.353
0.433
0.849
0.874
0.084
0.367
0.140
0.592
0.912
0.074
0.355
0.042
0.470
0.924
0.102
0.365
0.011
0.477
0.927
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Conduction Losses Forward Voltage Losses Switching Losses Total Losses Efficency
Power Losses at CCM and BCM (W)
One-Switch CCM One-Switch BCM Two-Switch CCM Two-Switch BCM
42. 6.5. Results
Comparison of the performance of the converters in
CCM vs. BCM:
Higher conduction losses at BCM
Lower switching losses for both topologies at BCM
Higher efficiency for both topologies at BCM
July 28, 2016 Development of SiC-Based PEBB 1000 42
43. 7. Conclusion
Does the Two-Switch Flyback Converter present a
better performance when compared to the One-Switch
topology?
Voltage across the MOSFET switches is clamped to Vin (no
high-voltage spikes)
Lower ringing effect
Lower switching losses
Higher efficiency
July 28, 2016 Development of SiC-Based PEBB 1000 43
44. 8. References
[1] “Improving the Performance of Traditional Flyback-Topology With Two-Switch –Approach”, J.
Pesonen; Texas Instruments
[2] “Understand Two-Switch Forward/Flyback Converters”, Y. Xi, R. Bell; National Semiconductor
[3] “Hard-Switching and Soft-Switching Two-Switch Flyback PWM DC-DC Converters and Winding
Loss due to Harmonics in High-Frequency Transformers”, D. M. Bellur, Wright State University
[4] “Two-Switch Flyback PWM DC-DC Converter in Continuous-Conduction Mode”, D. M. Bellur, M.
K. Kazimierczuk, Wright State University
[5] “Fundamentals of Power Electronics”, R. W. Erickson, D. Maksimovic, University of Colorado
Boulder
[6] “Characterization and Modeling of High-Switching-Speed Behavior of SiC Active Devices”,
Zheng Chen; Virginia Polytechnic Institute and State University
[7] “AN-9010 MOSFET Basics”, Fairchild Semiconductor
[8] “Analysis of SiC MOSFETs under Hard and Soft-Switching”, M. R. Ahmed, R. Todd, A. J.
Forsyth, The University of Manchester, UK
[9] “Power Electronics - A First Course”, N. Mohan, University of Minnesota
[10] “Development of an Isolated Flyback Converter Employing Boundary-Mode Operation and
Magnetic Flux Sensing Feedback”, M. V. Kenia, Massachusetts Institute of Technology
July 28, 2016 Development of SiC-Based PEBB 1000 44